online High resolution X-ray diffractometry and topography
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High resolution X-ray diffractometry and topography by Brian K. Tanner, D.K. Bowen
Download High resolution X-ray diffractometry and topography
High resolution X-ray diffractometry and topography Brian K. Tanner, D.K. Bowen
Language: English
Page: 278
Format: pdf
ISBN: 0850667585, 9780850667585
Publisher: CRC Press
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.
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